28
Apr
Many improvements in electronic miniaturization and efficiency can be tied to the development of capacitor technology, and minimizing the dielectric layer thickness has been the primary driver for improving capacitors. But dielectric layers are approaching the nanometer size, at which point they lose their ability to store charge. In last Sunday’s Nature Materials, a team from University of California Santa Barbera and Rutgers University provided a physical basis for the loss of performance in thin-film capacitors and suggested methods that could greatly improve the energy storage capacity in next-generation devices.
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Originally Syndicated via RSS from Ars Technica
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